News archive
- 29.11.23JEOL webinar
- 16.11.23Use of Labogene freeze dryers
- 08.11.23Particle contamination analysis
- 03.02.23New FIB
- 24.01.23webinars on solid state batteries
- 13.12.22Viruses under cryo ARM
- 27.09.22Coffee Talks Series
- 17.03.22News for Cryo-Electron-Microscopists
- 03.11.21Omnicontrol; control everything
- 09.08.21Atomic resolution electron microscope
- 21.04.21Do you have a wish regarding additional training?
- 24.03.21Jacomex glove boxes
JEOL updates
26.08.19
The following updates have been made on the global site.
Please feel free to check them from the following URLs.
2019/08/04
【News Release】
Release of a New Schottky Field Emission Scanning Electron Microscope
JSM-F100 ― The next level of analytical intelligence in FE-SEM for combining high resolution and operability ― https://www.jeol.co.jp/en/news/detail/20190804.3456.html
2019/08/04
【Application】
JEOL NEWS Vol. 54
https://www.jeol.co.jp/en/download_jeolnews.html
2019/08/04
【Products】
JSM-F100 Schottky Field Emission Scanning Elactron Microscope https://www.jeol.co.jp/en/products/detail/JSM-F100.html
【Products】
JSM-F100 Special Contents Open
https://www.jeol.co.jp/en/products/special_edition/2019/special01.html
For any questions or comments, do not hesitate to contact us.