Oxford Instruments

Oxford instruments provides leading - edge tools that enable materials characterisations and sample manipulation at the nanometer scale.

Used on electron microscopes (SEM and TEM) and ion beam systems - FIB. These tools are used for R&D across wide range of academic and industrial applications including semiconductors, renewable energy, mining, metallurgy and forensics.

  • Energy dispersive spectrometer (for SEM and FIBfor TEM)
  • Wavelength dispersive spectrometer (WDS)
  • Electron backscattered diffraction detector (EBSD)
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