News archive
- 23.04.19JEOL glossary update
- 03.04.19We hire
- 27.03.19New Benchtop SEM
- 25.03.19Biological Electron microscopy
- 21.03.19JEOL NMR expansion
- 22.05.18International bee day
- 26.03.18new SEM IT 200
- 09.03.18Nor-Cal and Dreebit
- 07.03.18TEM - Asbestos fibres
- 14.03.17New SDD EDS detector
- 13.03.17New SXES
- 29.02.16Slovene scientists first in the world proved the connection between ZIKA virus and Microcephaly
New SDD EDS detector
14.03.17
X Max Extreme:
New windowless EDS detectors designed specifically to collect low-energy X-rays (< 1 keV) and to work under ultra-low kV (< 3 kV) imaging conditions with the latest FE-SEMs offer new capabilities for elemental analysis. These capabilities include enhanced spatial resolution for the study of structures down to 10 nm or less, the characterization of surface features only 1–2 nm in thickness, the analysis of highly beam-sensitive or insulating materials, and much lower detection limits for light elements such as nitrogen and boron, as well as, for the first time, the detection of lithium. This offers an important breakthrough with potential for more detailed analysis of nano-materials, battery- and bio-materials, and semiconductors in the SEM.
