Scan

JEOL advantages

03.05.19

JEOL manufactures excellent FEGSEM electron microscopes with high resolution. Those have some patented advantages like:

• INLENS GUN (high and stable electronic currents for excellent analyzes with good spatial resolution even at low acceleration voltages 5kV)
• ACL - additional ACL lens (controls the diameter of the electron beam where the electron current can be changed arbitrarily from large to small; allows a large depth of field, which is greater than with conventional scanning electron microscopes)

Another advantage for is that for FEGSEM microscopes JEOL provides a 3-year guarantee for continuous emission of FEGSEM source.

 

Call us and we will be happy to advise you on a suitable FEGSEM model for your needs.

 

 

Superior resolution: JEOL uses a very conservative approach for measuring resolution in its catalogs and prefers to list in catalogs resolutions that are seemingly inferior to the competition, but in reality customer will allways get much better resolution as stated.

For example, for the JSM IT 800 HL model, the resolutions stated in the catalogue  can be proven at the customer site with the conservative edge method. There are different ways of resolution measurements , according to the ISO STD 25497: 2011 derivative method or according to the edge method 35% -65%, which is also widely used. JEOL can prove excellent resolution in its FEGSEMs by the method of your choice.

 

	JSM IT 800 HL	conservative method in the brochure  – edge method – guaranteed values	ISO STD 25497:2011 derivative method – guaranteed values	Attainable resolutions and  guaranteed values - Edge metoda 35%-65%
High vacuum (HV), SEI	20kV	0,7nm	0,65nm	<0,6nm
	1kV	1,3 nm	< 1 nm	0,9nm
	15kV, 5nA and analytical W.D.	3nm	1,9nm	<1,9nm
Low vacuum (LV)	30kV , 10Pa	1,3 nm	1,3nm	1,3 nm